burkert 8228寶德導(dǎo)電率
burkert 8228寶德導(dǎo)電率應(yīng)用于不同的工業(yè)工藝中,可在腐蝕性或濃縮介質(zhì)(如:酸液、堿液或者含鹽量高、測(cè)量范圍大的流體)中進(jìn)行測(cè)量。 這里有許多應(yīng)用,如:冷卻水監(jiān)測(cè)(比如:排污控制)、工業(yè)水處理或準(zhǔn)備,以及滴定設(shè)備監(jiān)測(cè)(比如:在 CIP 工藝中)。Used in different industrial processes, it can be measured in corrosive or concentrated media (e.g. acid, lye, or high salinity, large measurement fluid). There are many applications, such as cooling water monitoring (for example, pollution control), industrial water treatment or preparation, and titration equipment monitoring (e.g., CIP process).
burkert 8228寶德導(dǎo)電率特點(diǎn)
1.濃縮流體和廣泛的電導(dǎo)率范圍
2.用于直接調(diào)試的預(yù)定參數(shù)變量
3.直接連接至 PLC 的緊湊型測(cè)量?jī)x
4.診斷用工藝值模擬
5.PEEK, PVDF 或 PP 傳感器包含的規(guī)格。
1. Concentration of fluid and a wide range of conductivity
2. Predetermined parameter variables for direct debugging
3. Direct connection to PLC of the compact measuring instrument
4. Diagnostic process value simulation
5.PEEK, PVDF or PP sensors contain specifications.
The compact conductivity meter consists of a sensor, plugged-in and pined to an enclosure with cover, containing the transmitter module and a removable
display. The sensor cell consists of a pair of magnetic coils (called primary and secondary) in a PP, PVDF or PEEK holder. The integrated temperature
probe (without direct contact to the fluid) for automatic compensation is a standard feature in the conductivity sensor holder. Several compensation modes are
available and can be chosen to satisfy the needs for the different applications. The electronics of Type 8228 converts the measured signal, displays different
values in different physical units (if display mounted), monitors limits and computes the output signals. Depending on the variant the compact device
type 8228 is available with each one transistor and one 4..20 mA analogue outputs (1 x M12) or with each two transistor and two 4..20 mA analogue
outputs. (2 x M12).
The conductivity meter can operate independent of the display but it will be required for parameterize the device (i.e. selection of sensor cell constant, language,
measuring range, engineering units, calibration...) and also for visualizing continuously the measured and processed data.